Add ESP32 board for the Test/Target SMP tests - #75
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…tests Adds an ESP-IDF integration of the Test/Target performance-comparison tests (crit_speed, queue_speed, queue_contention, lock_contention_end_to_end) for the dual-core ESP32. One test per binary, selected via -DPERF_TEST=<name>. Config is driven from sdkconfig; a force-included board_test_config.h satisfies the framework include-order contract, and test_setting_config.h supplies the ESP32 timing (CPU cycle counter) and printf hooks.
Portable regression test for the fix that stops the scheduler-suspension owner core from being forced to yield. The victim pins to a core, suspends the scheduler, raises a ready same-core helper above itself (marking its own core to yield), then enters a task critical section - which spins forever in the run-state-change helper without the fix. No ISR required. Wired into the ESP32 board runner.
…test - CMakeLists auto-discovers the test source (<name>/<name>.c under tests/) and reads its entry function from testENTRY_FUNCTION_PROTOTYPE(...), so any test builds with -DTEST=<name> (legacy -DPERF_TEST= still works) - no per-test map. - board_test_config.h: add an XT_NOP() fallback for tests that busy-loop with portNOP() (undeclared in a plain test TU on the Xtensa port). - Runner task now matches the reference board (highest priority, no affinity); scheduler_owner_no_yield sets its own mid-range priority so it is independent of the runner priority. - Add sdkconfig.no_multi_prio for tests needing configRUN_MULTIPLE_PRIORITIES=0, and document ESP-IDF config compatibility in the README. Runs 10/12 functional SMP tests on ESP32; disable_multiple_priorities cannot build (needs configUSE_CORE_AFFINITY=0, fixed to 1 on ESP-IDF) and interrupt_wait_critical fails on a port critical-section-preemption difference.
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Adds an ESP-IDF board (
Test/Target/boards/esp32) that builds and runs the SMP target tests, including the granular-lock performance-comparison tests, on the dual-core ESP32.